PRECISION. INSIGHT. IMPACT.
Seeing beyond
the surface.
I’m Tanbir Sarowar. I build measurement systems that reveal what happens at the interfaces we can’t see.
Texas A&M University
Conceptual optical path · pulse motion slowed for illustration
Optics + Mechanics + Semiconductor metrology
30.6280° N 96.3344° W01 / RESEARCH IN FOCUS
Small interfaces.
Significant questions.
Understanding how silicon wafers deform, make contact, and bond—through measurements that leave the sample intact.
Wafer–chuck interfaces
Probing the hidden air gap and contact state beneath a 300 mm silicon wafer.
Explore projectHigh-speed deflectometry
Reconstructing full-wafer shape and following the dynamics of vacuum chucking.
Explore projectBonded-wafer inspection
Mapping interface quality for non-destructive inspection in 3D integration.
Explore projectTHE RESEARCHER
From an optical bench
to a better measurement.
I’m a doctoral researcher in the Precision Metrology & Instrumentation Group, advised by Dr. ChaBum Lee. My work connects custom instrumentation, physics-based models, and data analysis to understand semiconductor interfaces.
Before Texas A&M, I studied machine learning for microfluidic design at Washington State University and worked on High-NA EUV system qualification at ASML.
Explore my academic CVRESEARCH IS A CONVERSATION
Let’s make a connection.
Precision measurement, semiconductor manufacturing, or engineering education.
Get in touch